Article information
2017 , Volume 22, ¹ 3, p.32-44
Korneeva A.A., Shaidurov V.V.
Numerical analysis of temperature data from film thermistors of electronic boards
In this paper, the printed circuit board with electronic components is considered as a geometric structure consisted of rectangular cells coated by thin film thermistors whose local resistance essentially depends on the local temperature of the cell. Resistance measurement of long conductors is not carried out locally but rather on the horizontal and vertical segments. Therefore, the amount of these data on the resistance of the conductors is considerably less than the number of local resistances of all cells. However, using physical and qualitative considerations in some cases, it is possible to obtain the numerical solution. In particular, during functioning of the board, an overheating of individual elements may occur, resulting in temperature rise of the respective cells with corresponding increase of resistance of some circuit segments. In the paper, the problem for identifying such cells with overheating as well as their temperature using two additional physical considerations is set. Firstly, while overheating an element, the temperature of any cell cannot reduce. Secondly, the temperature gradient is mitigated by the heat transfer between the elements and cells. The mathematical formulation of these considerations leads to a non-singular system of linear equations for the determining of the overheating cells and their approximate temperature. The presented algorithms and computational experiments demonstrate the applicability of this approach.
[full text] Keywords: electronic boards, film thermistors, physical-mathematical model, numerical algorithms
Author(s): Korneeva Anna Anatolyevna Position: Senior Fellow Office: Siberian Federal University, Institute of space and information technology Address: 660041, Russia, Krasnoyarsk, 79 Svobodny pr.
E-mail: korneeva_ikit@mail.ru SPIN-code: 4798-1758Shaidurov Vladimir Victorovich Dr. , Correspondent member of RAS, Professor Position: Head of Research Office: Federal Research Center Krasnoyarsk Science Center of the Siberian Branch of the Russian Academy of Science Address: 660036, Russia, Krasnoyarsk 36, Akademgorodok 50, building 44
Phone Office: (391) 243 27 56 E-mail: shaidurov04@gmail.com SPIN-code: 7075-6423 References: [1] Shaidurov, V.V., Derevyanko, V.A., Vasilyev, E.N., Kosenko, V.E., Zvonar, V.D., Chebotarev, V.E. RESULTS AND PROSPECTS OF JOINT HEAT PHYSICAL RESEARCHES OF ICM OF THE SB RAS AND JSC “ACADEMICIAN M.F. RESHETNEV “INFORMATION SATELLITE SYSTEMS”. Vestnik Sibirskogo gosudarstvennogo aerokosmicheskogo universiteta imeni akademika M. F. Reshetneva. 2013; 6(52):107–110. (In Russ.) [2] Steinberg, D.S. Vibration analysis for electronic equipment. New York: Wiley; 2000: 406. [3] Lineber, F. Izmerenie temperatury v tekhnike [Measurement of temperature in the equipment]. Moscow: Metallurgiya; 1980: 544. (In Russ.) [4] Omega Temperature Measurement Handbook. Part Z. Stamford: Omega Ingineering; 2009: 259. [5] Practical Temperature Measurements. Application Note 290. Santa Clara: Agilent Technologies; 2012: 36. [6] Wood, S.D., Mangum, B.W., Filliben, J.J., Tillett, S.B. An investigation of the stability of thermistors. Journal Research of the National Bureau of Standards. 1978; 83(3):247–263. [7] Riddle, J.L., Furikava, G.T., Plumb, H.H. Platinum Resistance Thermometry. National Bureau of Standards, Monograph 126. Washington: U.S. Government printing office; 1972: 126. [8] Standard specification and temperature-electromotive force (EMF) tables for standardizied thermocouples. Vol. ASTM E230-98. West Conshohocken: American Society for Testing and Material; 1998: 176. [9] Strouse, G.F. Standard platinum resistance thermometer calibrations from the Ar TP to the Ag FP. Special Publication 250-81. Gaithersburg: National Institute of Standard and Technology; 2008: 79. [10] Mangum, B.W. Platinum resistance thermometer calibrations. National Bureau of Standards: Special Publication SP 250-22. Washington: U.S. Government printing office; 1987: 364. [11] Caltagirone, J.P. Reseau maille de conducteurs electriques, notamment pour mesure de temperatures. France: Demande de brevet d’invention No. 2315689, Intern. Classification G01Ê7/04, 1977: 5. [12] Rybochkin, A.F., Zaharov, I.S. Patent RF No. 2165695. À01Ê 47/00. Sposob kontrolya raspredeleniya teplovogo polya v ul'e [Method of controlling the distribution of the thermal field in a hive]. Bulletin ¹ 12. 27.04. 2001. (In Russ.) [13] Osgood, S., Ong, C.K., Downs, R. Touch screen control tips. Burr-Brown, Application Bulletin. USA: Texas Instruments; 2000: 9. [14] Wilkinson, J.H. The algebraic eigenvalue problem. Oxford: A Clarendon Press Publication; 1988: 680.
Bibliography link: Korneeva A.A., Shaidurov V.V. Numerical analysis of temperature data from film thermistors of electronic boards // Computational technologies. 2017. V. 22. ¹ 3. P. 32-44
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